Characterization of the nanomechanical properties of the fission yeast (Schizosaccharomyces pombe) cell surface by atomic force microscopy
E. Gibbs, J. Hsu, K. Barth, J. W. Goss
This study uses atomic force microscopy to characterize the nanomechanical properties of fission yeast cell surfaces during polarized growth, finding increased elasticity and decreased stiffness at growing cell poles.
bioRxiv · Jan 18, 2021Cell Biology