A data acquisition and analysis pipeline for scanning angle interference microscopy
Abstract
We describe open source software and hardware tools for calibrating, acquiring, and analyzing images for scanning angle interference microscopy (SAIM) analysis. These tools make it possible for any user with a TIRF microscope equipped with a motorized illumination unit to generate reconstructed images with nanometer precision in the axial (z) direction and diffraction-limited resolution in the lateral (xy) plane.
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