Single-shot super-resolution total internal reflection fluorescence microscopy
M. Guo, P. Chandris, J. P. Giannini, A. J. Trexler, R. Fischer, J. Chen, H. D. Vishwasrao, I. Rey-Suarez, Y. Wu, C. M. Waterman, G. H. Patterson, A. Upadhyaya, J. Taraska, H. Shroff
Abstract
We demonstrate a simple method for combining instant structured illumination microscopy (SIM) with total internal reflection fluorescence microscopy (TIRF), doubling the spatial resolution of TIRF (down to 115 +/-13 nm) and enabling imaging frame rates up to 100 Hz over hundreds of time points. We apply instant TIRF-SIM to multiple live samples, achieving rapid, high contrast super-resolution imaging in close proximity to the coverslip surface.
02 /Specification & Classification
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